Workshop on Dimensional Nanometrology with Atomic Force Microscopy - Sydney
Lehany Theatre, NMI Lindfield Laboratory Bradfield Road, West Lindfield, Sydney NSW 16/06/2011
The National Measurement Institute invites Atomic Force Microscope (AFM) users from university, government and industry laboratories to this one-day workshop on dimensional metrology with AFM. The aims of the workshop are to: raise awareness of issues related to dimensional metrology with AFM; provide an opportunity for participants to discuss approaches for maximising the accuracy of their AFM measurements and the performance of their instruments; and provide a forum for networking, discussion and exchange of ideas between participants. The workshop will feature presentations from leading researchers in the fields of AFM dimensional metrology, AFM materials metrology, nanopositioning and dimensional metrology with complementary microscopy techniques. Registration for the workshop is free and includes lunch and refreshments. To assist in planning please register before: Friday 10 June 2011.
Contact: Malcolm Lawn
Phone: (02) 8467 3502