Mr Daniel Golestan
PO Box 123
Broadway Sydney NSW
Research Group: University of Technology, Sydney; Institute of Nanoscale Technology.
Current Research ActivitiesThin film deposition - sputtering and evaporation
Thin film characterisation - spectrophotometry (transmittance and reflectance), optical modelling, photoelectron spectroscopy (UV and X-Ray), electron microscopy, scanning probe microscopy, cathodoluminescence, energy dispersive spectroscopy, X-ray diffractometry, VDP resistivity, Hall effect