The Nanometrology Section of the NMI has the pleasure to be hosting a half-day workshop on July 25th.

There are some excellent speakers attending, including Professor David Joy, University of Tennessee, Knoxville, USA, Associate Professor Joanne Etheridge, Monash University and Professor Simon Ringer, University of Sydney.

The topic of this workshop is metrology issues in electron microscopy.

For more information, please see the accompanying flyer and keep checking the website for updated information.