Scanning Probe and Structural Analysis Facility

Nanotechnology Capabilities:

• State of the art x-ray laboratory
• A clean room complex equipped with advanced instruments including a focused ion beam microscope, a UHV atomic force microscope, UV Raman spectrometer, keV focused ion beam microscope and electron microscopes
• Jeol AFM/STM UHV Scanning Probe System

Research Group:

University of Melbourne, Faculty of Science, School of Physics, Experimental Condensed Matter Physics

Contact Details:

David Jamieson
+ 61 3 8344 5376

School of Physics University of Melbourne Victoria 3010 Australia