Mr Daniel Golestan

 

PhD Candidate PO Box 123 Broadway Sydney NSW Australia 2007 Research Group: University of Technology, Sydney; Institute of Nanoscale Technology.   Email: link

 

Current Research Activities

Thin film deposition - sputtering and evaporation

Thin film characterisation - spectrophotometry (transmittance and reflectance), optical modelling, photoelectron spectroscopy (UV and X-Ray), electron microscopy, scanning probe microscopy, cathodoluminescence, energy dispersive spectroscopy, X-ray diffractometry, VDP resistivity, Hall effect  

Existing Linkages

CSIRO Future Manufacturing Flagship